 The MULTI-TEST is a sophisticated bit error rate tester in a compact, hand held package. It can test a wide variety of communications facilities and equipment including DDS, T-1, fractional T-1, E-1, fractional E-1, T-3 and E-3 NTUs, multiplexers, CSU/DSUs, T-1 CSUs, DTUs and TIUs. It includes a speaker to listen to voice in a DS0. It is supplied with change-able nickel metal hydride batteries and a built-in charger.
o Tests asynchronous, synchronous, DDS,
T-1, fractional T-1, E-1 and fractional E-1,
T-3 and E-3 facilities and equipment
o V.35, RS232, RS422/RS530, X.21, HSSI, DDS, T-1, E-1, T-3 and
E-3 interfaces
o Data rates from 50 bps to 50 Mbps
o Displays G.821 performance measurements
o Front panel switch control or Windows GUI -Or terminal Command Line Interface
control
o AC or battery power
T-1 and E-1 Testing
In the T-1 and E-1 modes, the Tester displays bit errors, transmit and receive
frequency, test seconds, bit error rate and G.821 performance measurements (errored
seconds, severely errored seconds, degraded minutes and available and unavailable
times). A variety of test patterns can be inserted in all or selected DS0s/timeslots,
continuous or non-contiguous, making the Tester ideal for fractional T-1 or E-1
testing. In the T-1 mode, it also displays RX level in db and volts.
T-3 and E-3 Testing
The Multi-Test can test T-3 and E-3 networks and CSUs. It performs G.821 measurements
and displays bit errors, bit error rate, frequency and more.
Async and Sync Testing
In the async and sync test mode, the Tester generates test data in a choice of
patterns and formats. The user can select from twenty-eight async and seventy-eight
sync test speeds. The Tester displays bit errors, bit error rate and total test
seconds. In the async mode, it displays characters received, character errors
and errored seconds. In the sync mode, it also displays TX frequency, RX frequency,
CTS delay and G.821 measurements.
DDS Testing
The Multi-Test also includes a DDS analyser. It can operate at speeds from 2400
to 72,000 bps in normal and Secondary Channel modes. It can simulate a CSU/DSU
to test networks or a network to test CSU/DSUs.
Easy to use
The Multi-Test can be controlled from the front panel or from a local or remote
terminal. It includes a two-line LCD display and nineteen LED indicators that
show selected mode, test and operating parameters. Parameters are selected by
scrolling through values stored in the tester
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MT 5000 Multi-Test Specifications
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ASYNC
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Speeds:50 to 115,000 bps
Displays:Character Errors, Characters Received, Total
Test Seconds and Errored Seconds
LEDS:Pattern Lock, Pattern Recovered, TXD, RXD, RTS, CTS,
DSR, CD, and DTR
Patterns:2^9 (511), 2^11 (2047), Binary, Fox Test, Mark and
Space
Loops:Self-Test
Interfaces:V.35, RS530, RS422 and RS232 Physical: DB 25 pin
Female |
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SYNC
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Speeds:1,200 to 50,000,000 bps
Displays:Bit Errors, Bit Error Rate, Test Secs, Errored
Secs, Severely Errored Secs, Degraded Mins, Available, Unavailable,
RX Freq,
TX Freq, Bits Received, RTS Time, Round Trip Delay
LEDSPattern Lock, Pattern Recovered, Transmit Data, Receive Data,
RTS (C), CTS, DSR, CD (I), DTR, TXC, RXC (S), and External TXC
Patterns:2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU
2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, Alt, Mark, Space, Round Trip Delay
and User 3 - 32
Loops:Self-Test and V.54
Interfaces:V.35/DB25, RS530/DB25, RS422/DB25, RS232/DB25, X.21/DB15
and HSSI/50 pin |
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DDS
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Speeds:2,400 to 72,000 bps
Displays:Bit Errors, Bit Error Rate, Test Secs, Errored
Secs, , Secondary Errors, Severely Errored Secs, Degraded Mins,
Available, Unavailable, RX Freq , TX Freq, Bits, RX Level dB,
Simplex Current, Round Trip Delay and RLOS Secs
LEDS:Pattern Lock, Pattern Recovered, CMI (IDLE), All 1s, All 0s,
RLOS, OOF, OOS, CSU Loop, DSU Loop and V.54 Loop
Patterns:2^9 (511), 2^11 (2047), 2^15, QRSS, 1 of 8, 3 of 24, Alt,
Mark, Space, DDS1, DDS2, DDS3, DDS4, Round Trip Delay and User 3 - 32
Loops:Self-Test, CSU Loop , DSU Loop and V.54 Loop
Interfaces:Four wire, BiPolar Physical: RJ48S |
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T-1
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Speed:1,544,000 bps
Displays:Bit Errors, Bit Error Rate, Test Secs, Errored
Secs, Severely Errored Secs, Degraded Mins, Available, Unavailable,
RX Freq, TX Freq, Signalling Bits, Density Errs, Frame Errs,
CRC Err, BPV Err, RX Level Volts & dB, Slips, Round Trip Delay
LEDS:Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS,
CRC Err, BPV, D4, ESF, AMI, B8ZS and Yellow
Patterns:2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU
2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, T-1 DALY, T-1 DALY UF, 55 Octet,
55 Octet UF, Alt, Mark, Space , Digimwatt, User 3 - 32, Round Trip Delay,
DDS OCU Loop, DDS CSU Loop and DDS DSU Loop
Loops:Self-Test, ATT Loop U/D, ANSI Loop U/D, ATT Payload, ANSI
Payload, Smart Jack 1 & 2 (Framed & Unframed) and V.54
Interfaces:DS1 BiPolar, 110 Ohm, AMI/B8ZS Coding Physical: RJ48C
and Dual Bantam
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E-1
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Speed2,048,000 bps
Displays:Bit Errors, Bit Error Rate, Test Secs, Errored
Secs, Severely Errored Secs, Degraded Mins, Available, Unavailable,
RX Freq,
TX Freq, CRC Errs, BPV Errs Frame Errs and Clock Slips
LEDS:Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS,
CRC Err, BPV, DMFA and RRA
Patterns:2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU
2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, Alt, Mark, Space, Digimwatt and
User 3 - 32
Loops:Self-Test and V.54
Interfaces:G.703/704, 75 & 120 Ohm, HDB3 Coding Physical: Dual
Bantam, Dual BNC and RJ48C |
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T-3
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Speed:44,736,000 bps
Displays:Bit Errors, Bit Error Rate, Test Secs, Errored
Secs, Severely Errored Secs, Degraded Mins, Available, Unavailable,
RX Freq, TX Freq, P-Bit Errs, C-Bit Errs, T3 & T2 Frame Errs,
LCV Err, FEBE Err,
Excessive 0s and LOS Secs
LEDS:Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS,
LOF, LCV, FEBE, Yellow, M13 and C-Bit
Patterns:2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU
2^20, 2^23, ITU 2^23, 1111, IDLE 1100, AIS 1010, 0000,
1 of 8 and User 3 - 32
Loops:Self-Test and CSU
Interfaces:DS3 BiPolar, 75 Ohm Physical: Dual Mini WECo 560A |
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E-3
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Speed:34,368,000 bps
Displays:Bit Errors, Bit Error Rate, Test Secs, Errored
Secs, Severely Errored Secs, Degraded Mins, Available, Unavailable,
RX Freq , TX Freq, LCVs, LOS Secs and Frame Errs
LEDS:Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue),
RLOS, LOF, BPV, and RAI
Patterns:2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU
2^20, 2^23, ITU 2^23, 1 of 8, Alt, Mark, Space and User 3 - 32
Loops:Self-Test and LINE
Interfaces:G.703/751, 75 Ohm, HDB3 Coding Physical: Dual Mini WECo
560A |
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| Mechanical:The Multi-Test measures 8.75" (22.2
cm) H x 7.5" (19.1 cm) W x 4" (10.2 cm) D and weighs 4.4 lbs (1.81
kg) |
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